LabVIEW VI Analyzer Toolkit 2024 Q1

← LabVIEW VI Analyzer Toolkit 2023 Q1

LabVIEW VI Analyzer Toolkit ↑

LabVIEW VI Analyzer Toolkit 2025 Q1 →

Tests

Tests included with LabVIEW VI Analyzer Toolkit 2024 Q1 by category:

• LabVIEW VI Analyzer Toolkit
  • Block Diagram
    • Performance
      • Arrays and Strings in Loops
      • Coercion Dots
      • Enabled Debugging
      • In Place Element Structure Usage
      • Inlinable VIs
      • Parallel For Loop Debugging
      • Parallelizable Loops
      • Prepend Scalar With Build Array
      • Redundant Boolean Operations
      • Value Property Usage
      • Wait in While Loop
      • Wired Terminals in Subdiagrams
    • Style
      • Array Constant Style
      • Backwards Wires
      • Case Structure Default Frame
      • Code Simplification
      • Control Terminal Label Visible
      • Control Terminal Wiring
      • Diagram Disable Structures
      • Mixed Terminal Styles
      • Poor Names of Enum Items
      • Sequence Structure Usage
      • String Constant Style
      • Tunnel Position
      • Unused Code
      • Wire Bends
      • Wire Crossings
      • Wires Under Objects
    • Warnings
      • Adding Array Size Elements
      • Array Sum and Product Overflow
      • Breakpoint Detection
      • Bundling Duplicate Names
      • Case Structure with String Range
      • Error Cluster Wired
      • Find Deprecated Items
      • For Loop Error Handling
      • For Loop Iteration Count
      • For Loop Reference Handling
      • Globals and Locals
      • Hidden Objects in Structures
      • Hidden Tunnels
      • Indexer Datatype
      • Pattern Label
      • Reentrant VI Issues
      • Type Casting References
      • Unwired I32 Error
  • Complexity Metrics
    • Cyclomatic Complexity
    • Depth of Nesting of Structures
    • Fan In
    • Fan Out
    • Modularity Index
  • Documentation
    • Developer
      • Approved Bookmark Tags
      • Comment Usage
      • Label Call Library Nodes
      • Revision History
    • User
      • Spell Check
      • VI Documentation
  • Front Panel
    • SubVI
      • Array Default Values
      • Cluster Sized to Fit
      • Control Alignment
    • User Interface
      • Alignment Grid Setting
      • Clipped Text
      • Dialog Controls
      • Duplicate Control Labels
      • Empty List Items
      • Font Usage
      • Overlapping Controls
      • Panel Size and Position
      • Scalar Chart Updates
      • Synchronous Display
      • Transparent Labels
  • General
    • File Properties
      • SubVI and TypeDef Locations
      • VI Extension
      • VI Name
      • VI Saved Version
      • VI Size
    • Icon and Connector Pane
      • Connector Pane Alignment
      • Connector Pane Pattern
      • Default Icon
      • Error Style
      • Full Connector Pane
      • Icon Size and Border
      • Polymorphic Terminals
      • Terminal Connection Type
      • Terminal Positions
    • VI Properties
      • Auto Error Handling Enabled
      • Broken VI
      • Built Application Compatibility
      • Control VI Type
      • Driver Usage
      • Platform Portability
      • Removed Diagram
      • Separate Compiled Code Setting
      • Toolkit Usage
      • VI Lock State
  • VI Metrics
    • Connector Inputs and Outputs
    • Controls and Indicators
    • Diagram Count
    • Diagram Size
    • Node Count
    • Property Reads and Writes
    • Shared Library Calls
    • Structure Count
    • Wire Sources

• LabVIEW VI Analyzer Toolkit
  • Block Diagram
  • Complexity Metrics
  • Documentation
  • Front Panel
  • General
  • VI Metrics